Dresden 2026 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 56: Scanning probe techniques: Method development II
O 56.3: Vortrag
Mittwoch, 11. März 2026, 11:00–11:15, HSZ/0401
Spatially Resolved Mode Analysis of Ultra-Long qPlus Probes for STM/AFM — •Aleksander Bogucki1,3, Yeon-Ji Kim1,2, Yewon Kim1,2, Sarah Yi1,2, German Orlov1, 3, Lei Fang1, 3, Wonjun Jang1,3, and Andreas Heinrich1,2 — 1Center for Quantum Nanoscience (QNS), Institute for Basic Science (IBS), Seoul 03760, Republic of Korea — 2Department of Physics, Ewha Womans University, Seoul 03760, Republic of Korea — 3Ewha Womans University, Seoul 03760, Republic of Korea
Combined scanning tunneling and atomic force microscopy (STM/AFM) based on quartz tuning forks (qPlus) typically relies on short tip lengths (<0.5 mm) for optimal performance. However, restricted sample environments such as liquid cells or setups requiring significant clearance for high-numerical-aperture optical elements demand probe geometries far exceeding standard dimensions. While tips in the 1-3 mm range have been recently explored [1], the dynamics of significantly longer tips are less well characterized.
We present a systematic study of qPlus sensors with ultra-long tips (>8 mm). We correlate electrical response spectra with spatially resolved optical vibrational analysis to map eigenmodes and identify non-vertical components. Supported by FEM simulations, we demonstrate that tip material and geometry can be optimized to tune the spectral response. Finally, we assess the potential of these ultra-long designs for specialized SPM setups.
References: [1] T. Yamada et al., Nanoscale Adv. 5, 840-850 (2023).
Keywords: qPlus sensor; Atomic Force Microscopy; Scanning Tunneling Microscopy; Finite Element Method; Optics-combined scanning probe microscopy