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O: Fachverband Oberflächenphysik
O 74: Graphene: Electronic structure, excitations, etc. – Poster (joint session O/TT)
O 74.9: Poster
Mittwoch, 11. März 2026, 18:00–20:00, P2
Mesoscopic Lateral Intercalation Dynamics of Indium Between the Epitaxial Zero-Layer of Graphene and SiC — •Benno Harling1, Zamin Mamiyev2, Narmina Balayeva2, Dietrich R.T. Zahn2, Christoph Tegenkamp2, and Martin Wenderoth1 — 1IV. Physikalisches Institut, Georg-August-Universität, Friedrich-Hund-Platz 1, 37077, Göttingen, Germany — 2Institut für Physik, Technische Universität Chemnitz, Reichenhainer Str. 70, 09126, Chemnitz, Germany
Intercalation, the process of diffusing a material species in-between layered materials, can be utilized for both bulk and 2D systems to achieve tailored electronic properties. [1] For the 2D limit, this work investigates the lateral diffusion dynamics of indium intercalation into the epitaxial zero-layer of graphene on SiC using Kelvin Probe Force Microscopy (KPFM). For tin, material transfer across surface substrate steps is observed at local sites at the mesoscopic scale. [2] With the used experimental parameters, we find that this is not the case for indium intercalation. Instead, only terrace transport is observed. The KPFM measurements were complemented by micro-Raman spectroscopy, assessing the extent and uniformity of In intercalation. Remarkably, intercalation through the carbon layer seems to be dependent on the graphene or substrate properties that still need to be further resolved. This leads to a situation where just some of the terraces are observed to be intercalated. Financial support by the DFG within Research Unit FOR5242 is acknowledged. [1] Stark et al., Adv. Mater. 2019, 31, 1808213 [2] Harling et al., Carbon 244 (2025) 120711
Keywords: Intercalation; Graphene; Work Function; AFM KPFM KFM; Indium