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O: Fachverband Oberflächenphysik
O 79: Plasmonics and nanooptics: Light-matter interaction, spectroscopy III
O 79.7: Vortrag
Donnerstag, 12. März 2026, 12:00–12:15, HSZ/0403
Inelastic electron-light interaction probed by holographic scanning transmission electron microscopy — •Tim Dauwe1,2, Nora Bach1,2, Murat Sivis1,2, and Claus Ropers1,2 — 1Max Planck Institute for Multidisciplinary Sciences, Göttingen, Germany — 24th Physical Institute, University of Göttingen, Germany
Ultrafast Transmission Electron Microscopy (UTEM) is a unique tool to study inelastic electron-light scattering (IELS). Photon-Induced Near-Field Electron Microscopy (PINEM) can now routinely image optical fields at laser-excited nanostructures in magnitude. Phase-resolved imaging is enabled by sequential interactions [1,2]. However, this requires an elaborate geometry with multiple optical interaction stages and offers only limited variability in tailoring the interaction. In this work, we combine IELS with a STEM holography approach, using two spatially separated, coherent electron probes [3]. By recording the interference pattern in the far field behind an electron spectrometer, we get simultaneous access to the energy of the electrons and the phase imprinted during the inelastic interaction. Our results from two interfering quantum walks reveal exotic electron states governed by interaction strengths and relative phase differences. Our approach further enhances the UTEM near field imaging capabilites and enables tailoring of electron states by multiple parallel electron-light interactions.
[1] D. Nabben et al., Nature 619 (2023)
[2] J.H. Gaida et al., Nat. Photon. 18 (2024)
[3] F.S. Yasin et al., J. Phys. D: Appl. Phys. 51 205104 (2018)
Keywords: Ultrafast Transmission Electron Microscopy; Phase Contrast; Holography