Dresden 2026 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 93: Electronic structure of surfaces: Spectroscopy, surface states III
O 93.2: Vortrag
Freitag, 13. März 2026, 09:45–10:00, HSZ/0201
A novel approach to depth-resolved magnetic spectoscopy: grazing-incidence XMCD — •Umut Parlak1, Katharina Wehrstein1, Pia Maria Düring1, Oliver Rehm1, Endrit Kusari1, David Capalbo1, Andrei Gloskovskii2, Christoph Schlueter2, Lutz Baumgarten3, and Martina Müller1 — 1Fachbereich Physik, Universität Konstanz, 78457 Konstanz, Germany — 2Deutsches Elektronen-Synchrotron, 22607 Hamburg, Germany — 3Peter Grünberg Institut, PGI-6, Research Centre Jülich, 52425, Jülich, Germany
Magnetic depth profiling plays a key role in understanding inter- and intra-layer magnetic coupling mechanisms in multilayer thin films. We employ a synchrotron-based photoelectron spectroscopy approach (P22 beamline, DESY) to measure x-ray magnetic circular dichroism with depth-resolution taking EuO thin films grown on heavy metal (HM) underlayers as prototype sample. The presence of HM underlayer enables the near-total reflection x-ray excitation, where the incident and reflected x-rays interfere at the grazing angles forming high-intensity nodal points. The depth-resolution is achieved by probing at angles between 0.2 and 1∘, i.e., tuning the position of the nodal points. Simulations of the x-ray intensity profile at these low angles allow us to optimize the MBE-grown MgO/EuO/HM trilayer structure for accessing both the upper and lower interfaces. Our results reveal the distribution of Eu2+ and Eu3+ ions throughout the EuO layer, which form ferromagnetic and paramagnetic oxides, respectively. The valency profile of the Eu ions directly aligns with the magnetic asymmetry profile.
Keywords: magnetic spectroscopy; ferromagnetic oxides; XMCD; grazing-incidence excitation; magnetic depth-profile