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TT: Fachverband Tiefe Temperaturen

TT 82: Cryogenic Detectors and Sensors

TT 82.4: Vortrag

Donnerstag, 12. März 2026, 15:45–16:00, HSZ/0103

A novel dilution refrigerator based microwave impedance microscopy — •Yizhou Wei and Berthold Jäck — The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong

Microwave Impedance Microscopy (MIM) is an advanced imaging technique that offers remarkable sensitivity in detecting spatial variations of the electric conductivity with a spatial resolution of between 10 and 100 nanometers. This makes it a powerful tool for investigating 2D materials, especially in the context of topological and many-body physics of moiré materials. Despite its scientific potential, several technical challenges hinder the broader application of MIM for the study of quantum materials at cryogenic temperatures. Major issues are the pervasive noise introduced by dry cryogenic systems, particularly due to the pulse tube, and the thermalization of the microscopy module to temperatures below 100 mK. To address these challenges, we have designed and realized a novel MIM system that is both noise-resistant and capable of operating at ultra-low temperatures. In this talk, we will present key design considerations as well as first results from test measurements that validate the performance of our experimental setup.

We gratefully acknowledge funding by the Croucher Foundation (Grant No.CIA22SC02).

Keywords: dilution refrigerator; microwave impedance microscopy; low noise; low temperature; 2D material