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T: Fachverband Teilchenphysik

T 27: Muon Detectors

T 27.1: Talk

Tuesday, March 17, 2026, 16:15–16:30, KH 00.023

Development of a test bench for the MDT front-end electronics and L0 MDT Trigger Processor full-slice tests at the expected HL-LHC rates — •Georgios Lamprinoudis, Gia Khoriauli, Raimund Ströhmer, and Thomas Trefzger — Julius-Maximilians-Universität Würzburg

The new electronic readout of the Muon Drift Tube (MDT) chambers is a key component of the ATLAS Phase 2 upgrade for HL-LHC. The system will incorporate new mezzanine boards and chamber service modules of the MDT front-end electronics in conjunction with the new L0 MDT Trigger Processor. The development of this electronic chain requires continuous quality control and assessment. The test bench is being designed to fulfil both of these tasks by using simulated muon samples to emulate the operation and performance of the full-slice MDT readout and to optimize the muon L0 trigger.

Keywords: Muon; ATLAS; HL-LHC; Trigger; MDT