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T: Fachverband Teilchenphysik

T 52: Silicon Detectors V

T 52.7: Vortrag

Mittwoch, 18. März 2026, 17:45–18:00, KH 01.012

The ATLAS High Granularity Timing Detector: Quality Control Results on Low Gain Avalanche Diodes — •Theodoros Manoussos^1,2, Simon Koch¹, Guilherme Saito³, Marco Leite³, Dominik Dannheim¹, Stefan Guindon¹, and Lucia Masetti² — ¹CERN — ²Johannes Gutenberg-Universität Mainz, Germany — ³Universitade de São Paulo, Brasil

The increase in instantaneous luminosity at the High Luminosity-LHC will be a challenge for the ATLAS detector, as the pile-up is expected to increase to an average of 200 interactions per bunch crossing. To sustain current physics performance and mitigate pile-up effects, a High Granularity Timing Detector (HGTD) will be integrated into the ATLAS end-cap regions, covering a pseudorapidity range of 2.4 ≤ | η | ≤ 4.0. HGTD aims to achieve 30   ps per-track time resolution for MIPs in the beginning of the lifetime, up to 50   ps after a maximum fluence of 2.5 · 10¹⁵   n_eq/cm². High-precision timing information improves the correct assignment of tracks to vertices. HGTD sensors are based on the Low Gain Avalanche Diode (LGAD) technology. They provide moderate internal gain, resulting in fast rise time and large signal-to-noise ratio, required for excellent time resolution. Each sensor is a 15 × 15 array of 1.3 × 1.3   mm² LGAD pads. Along with the sensors, an equal amount of Quality Control-Test Structures (QC-TS) is produced to monitor the quality and uniformity of wafers and extract various technology and fabrication parameters during production. This contribution presents process quality control measurements on QC-TS of the initial phase of the HGTD sensor production.

Keywords: ATLAS Phase II Upgrade; Timing Detectors; LGADs; HGTD; Silicon Devices