Erlangen 2026 – wissenschaftliches Programm
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T: Fachverband Teilchenphysik
T 55: Silicon Detectors VI
T 55.6: Vortrag
Mittwoch, 18. März 2026, 17:30–17:45, KH 01.022
Investigation of neutron-induced single-event effects in the Belle II PXD overvoltage protection logic — •Jannes Schmitz, Florian Bernlochner, Jochen Dingfelder, and Hans Krüger — University of Bonn
The Belle II experiment at the SuperKEKB collider in Tsukuba, Japan, collects e+e− collision data reaching a record-breaking instantaneous luminosity of 5.1·1034 cm−2s−1 in December 2024. The innermost Belle II sub-detector is the PiXel Detector (PXD), which is based on modules with Depleted P-channel Field Effect Transistor (DePFET) sensors. Each PXD module is powered by a custom-made power supply, providing 23 channels for the DePFETs operational voltages, linear post regulation and overvoltage protection circuitry. Although located on top of the Belle II detector and far away from the interaction region, the PXD power supplies triggered false overvoltage events induced by increased beam backgrounds during operation. Expecting a proportional increase up to the target instantaneous luminosity of 6·1035 cm−2s−1, investigations started to find the cause of these effects and minimize the resulting downtime of the detector.
This talk will discuss the observed neutron-induced single-event effects, covering improvements of the firmware as well as dedicated studies of its effectiveness in neutron-rich accelerator environments.
Keywords: Belle II; Silicon Detectors; PXD