Erlangen 2026 – wissenschaftliches Programm
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T: Fachverband Teilchenphysik
T 9: Silicon Detectors I
T 9.3: Vortrag
Montag, 16. März 2026, 16:45–17:00, KH 01.012
An overview of the European XFEL’s bespoke DSSC DEPFET single module detector characteristics and integration — •Mina Mohebbi1,2, Erika Garutti2, and Monica Turcato1 — 1European XFEL, Schenefeld, Germany — 2University of Hamburg, Hamburg, Germany
The unique beam properties of the European XFEL, including its high brilliance and pulse structure, impose stringent requirements on X-ray imaging detectors in terms of dynamic range, signal-to-noise ratio, and readout speed. The DEPFET Sensor with Signal Compression (DSSC) detector, developed by an international consortium together with the European XFEL, addresses these challenges for soft X-ray detection in the 0.5-6 keV range. With a sensitive area of 241× 251 mm2, the DSSC enables single-photon sensitivity while providing a dynamic range of several thousand photons at frame rates up to 4.5 MHz. Although the full 1-megapixel DSSC system demonstrates excellent performance, its extensive and complex infrastructure limits portability and broader applicability. To overcome these constraints, a compact single-ladder system, the DSSCsm, has been developed. It features a 128 × 512 pixel sensitive area and incorporates a thermoelectric cooling design that removes the need for bulky cryogenic components. The DSSCsm preserves the dynamic range and fast readout capabilities of the full system while significantly reducing size, weight, and support requirements. This makes it well suited for experiments requiring an active area of 125 × 30 mm2. This talk will present the DSSCsm design, operating infrastructure, and characterization and calibration techniques.
Keywords: European XFEL; Soft X-ray detection; DEPFET Sensor with Signal Compression; DSSCsm