Mainz 2026 – wissenschaftliches Programm
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Q: Fachverband Quantenoptik und Photonik
Q 61: Matter Wave Interferometry and Metrology III
Q 61.5: Vortrag
Donnerstag, 5. März 2026, 15:30–15:45, P 11
Exploring few-shot quantum metrology with photonic qubits — •Lukas Rückle1, 2 and Stefanie Barz1, 2 — 1Institute for Functional Matter and Quantum Technologies, University of Stuttgart, 70569 Stuttgart, Germany — 2Center for Integrated Quantum Science and Technology (IQST)
The use of quantum states for metrology tasks has been proven to surpass classical precision limits for the estimation of parameters. Recently, the framework of probably approximately correct (PAC) metrology has been introduced. It not only enables the estimation of a parameter in an arbitrarily big parameter space without prior knowledge, but also gives bounds for few- and single-shot metrology settings. It thus bridges the rather theoretical case of performing infinitely many measurements and practical metrology tasks.
Here, we present experimental results in a photonic metrology setting. We show how to use different states and measurements and how for each case to optimize the prediction strategy of the parameter that shall be estimated. Our work shows how to implement the given new framework of PAC metrology and thus helps improving the precision of applications that only allow for a few measurements, e.g. when measuring fast varying systems.
Keywords: quantum metrology; probably approximately correct metrology; quantum optics