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Q: Fachverband Quantenoptik und Photonik

Q 61: Matter Wave Interferometry and Metrology III

Q 61.8: Vortrag

Donnerstag, 5. März 2026, 16:15–16:30, P 11

Concurrent atom interferometry for in situ beam characterization — •Christian Struckmann, Knut Stolzenberg, Daida Thomas, Ernst M. Rasel, Dennis Schlippert, and Naceur Gaaloul — Leibniz University Hannover, Institute of Quantum Optics, Welfengarten 1, 30167 Hannover, Germany

Quantum sensors based on the interference of matter waves provide a highly sensitive and stable measurement tool for inertial forces with applications in geodesy, navigation, and fundamental physics. One of the leading systematic effects limiting the sensitivity of state-of-the-art atom interferometers is wavefront aberrations. Residual curvature and higher-order distortions of the interrogation beams imprint spatially varying phases across the atomic ensemble, leading to systematic biases. Conventional optical diagnostics only partially capture these effects and do not reflect the in situ, atom-averaged response. This motivates direct, atom-based characterization of the interrogation fields to push the limits of accuracy and robustness.

In this contribution, we present the application of PIXL (Parallelized Interferometers for XLerometry), a novel method to operate a quantum sensor based on a 2D array of Bose-Einstein condensates, to the 3D characterization of the interrogation beam's wave vector and intensity profiles [Stolzenberg et al., Phys. Rev. Lett. 134, 143601 (2025)].

Keywords: Atom interferometry; Wavefront aberrations; Inertial sensing; Metrology; Beam characterization