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DS: Dünne Schichten
DS 11: Charakterisierungsverfahren II
DS 11.1: Vortrag
Montag, 17. März 1997, 16:30–16:45, H 55
X-ray standing waves in epitaxial H-Tc thin films — •A. Kazimirov1, J. Zegenhagen1, T. Haage1, L. Ortega2, A. Stierle2, and F. Comin2 — 1Max-Plank-Institut für Festkörperforschung, Stuttgart, Germany — 2ESRF, Grenoble, France
X-ray standing wave are generated as a result of the interference between incident and reflected X-ray beams. Bragg reflection from the perfect single crystal is typically used with monitoring of the yield of fluorescence or other secondary process as a function of the glancing angle. Standing wave pattern can be calculated using dynamical X-ray diffraction theory. The obvious limitation of this technique is the required structural perfection of the standing wave ’generator’. We show a way to circumvent this problem by creating of a x-ray standing wave in a thin epitaxial film. This has two main advantages: (1) the angular width of the rocking curve for thin crystal is strongly enhanced that makes this technique much less sensitive to the lattice perfection; (2) many materials which are available as good quality thin films but not as bulk crystals can be investigated. Here, we applied this approach for the study of SmBa2Cu3O7−δ epitaxial films on SrTiO3(001). The experiments were performed at the ESRF (Grenoble, France), ID32 beamline. Sm-L and Ba-L fluorescenc excited under conditions of 005 reflection of 7.7keV synchrotron radiation beam was measured. Possible structural models to interpret the experimental data are discussed.