Münster 1997 – wissenschaftliches Programm

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O: Oberflächenphysik

O 26: Methodisches (Experiment)

O 26.3: Vortrag

Mittwoch, 19. März 1997, 16:30–16:45, BOT

A Novel Surface Science Instrument: Double Reflexion Electron Emission Microscope — •K. Grzelakowski — FOCUS GmbH

A universal instrument, the double reflection electron emission microscope (DREEM), for surface imaging, diffraction, and local (1 µm resolution) spectroscopic measurements is presented. DREEM consists of three fully electrostatic lens systems: electron gun column, immersion objective lens and imaging column. The novel illumination system incorporates an electron micro–reflector in the back focal plane of the objective, where the perpendicular optical axes of the electron gun and imaging column cross. The electron micro–reflector consists of the tip of a (100) orientated single–cristalline W–wire with a face area of 25µm². The primary electrons of energy from 1kV to 6kV elastically reflect from the tip surface and are decelerated between the objective and grounded sample to the desired impact energy from 0V to 5kV. Numerous contrast mechanisms are available for image formation with DREEM including topographic, magnetic, chemical (Auger, core level), work function, LEEM (diffraction, phase), mirror electron microscopy (MEM), photoemission (PEEM), etc. The first results obtained with the DREEM will be presented.