Regensburg 2002 – wissenschaftliches Programm
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O: Oberflächenphysik
O 16: Elektronische Struktur (III)
O 16.3: Vortrag
Dienstag, 12. März 2002, 11:45–12:00, H36
Structural and magnetic properties of FeMn thin films on Cu(001) — •F. Offi, W. Kuch, L. I. Chelaru, J. Barthel, and J. Kirschner — Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle
The structural and magnetic properties of FexMn1−x alloy thin films grown on Cu(001) and on Co/Cu(001) are investigated. A pseudomorphic layer-by-layer growth mode of the alloy films in a large range of concentrations is deduced from the presence of regular oscillations in the medium energy electron diffraction specular intensity during deposition on top of Cu(001) and on Co/Cu(001). For the alloy at equiatomic concentration evaporated on Cu(001) this observation is confirmed by means of scanning tunneling microscopy. Fe50Mn50 thin films growing on Cu(001) and on Co/Cu(001) keep the antiferromagnetic fcc γ structure as observed by low energy electron diffraction experiments. Magnetization curves, recorded in situ exploiting the magneto-optic Kerr effect, have been measured from Co/FexMn1−x bilayers on Cu(001). A sudden increase of coercive field, when the FeMn film overcomes a certain thickness, is related to the antiferromagnetic state of the FeMn film itself. This observation allows to measure the antiferromagnetic ordering temperature of FexMn1−x films of different concentrations and thicknesses.