Dresden 2003 – wissenschaftliches Programm
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DS: Dünne Schichten
DS 3: „Dünnschichtanalytik“ III (Beitr
äge)
DS 3.4: Vortrag
Montag, 24. März 2003, 16:35–16:50, GER/37
X-ray measurements on extremely confined soft matter thin films — •Milena Mihaylova1, Oliver H. Seeck1, Deniza Lambreva2, Yaelle Serero2, and Wim de Jeu2 — 1IFF, FZ Jülich GmbH, 52425 Jülich, Germany — 2FOM-Institut AMOLF, Kruislaan 407, 1098 SJ-Amsterdam, The Netherlands
It is well known that the properties of soft matter films depend on the distance from the substrate-film interface. Especially, close to the interface they differ from the usual bulk behavior. This is not only because of the interactions with the substrate but also simply due to the break in symmetry at the interface. Confining soft matter in a gap formed by two substrates which are only several nanometers (but also up to a micron) apart causes a nearly 2-dimensional system with a strong influence of the substrates over the whole film. Completely new film properties are expected.
In this talk we present an experimental setup to investigate confined soft matter thin films at different temperatures, different gap sizes and perpendicularly applied pressures. It is built for the use at x-ray diffractometers namely at those located at synchrotron radiation sources. Data and results on studies with simple liquids such as CCl4 and polymers such as PEO-b-PBH using x-ray reflectivity and small angle scattering methods will be shown to demonstrate the effects of confinement on the soft matter films.