Dresden 2003 – wissenschaftliches Programm
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MA: Magnetismus
MA 17: Magnetische Dünne Schichten II
MA 17.7: Vortrag
Mittwoch, 26. März 2003, 17:30–17:45, HSZ/04
X-ray magnetic reflection spectroscopy at the 3p absorption edges of thin Fe and Co films — •Michael Hecker1, Peter M. Oppeneer1, Claus M. Schneider1, Sergio Valencia2, and Hans-Christoph Mertins2 — 1IFW Dresden — 2BESSY Berlin
Thin films and multilayers composed of 3d transition metals are presently of great fundamental and technological importance. We investigated the possibility to measure X-ray magnetic effects in reflection at the 3p edges of ferromagnetic 3d elements. We find that the resonant enhancement of the X-ray reflectance at the 3p edges yields strong magnetic effects, which are, in particular, larger than those previously reported. We present results for two kinds of magnetic reflection effects: (a) the transversal Kerr effect (T-MOKE), which is linear in the magnetization, and (b) the X-ray linear magnetic dichroism (XMLD) in reflection, which is quadratic in the magnetization. Magnetic spectra were recorded in the energy range of 40 to 70 eV, and as a function of incidence angle. Huge T-MOKE signals were observed, which dependence on the incidence angle can be explained in the framework of Fresnel reflection coefficients. The XMLD reflection signal is smaller, but clearly observable. Our investigation indicates the opportunity to study both ferromagnetic and antiferromagnetic layers using resonant magnetic reflectance at the 3p edges.