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O: Oberflächenphysik

O 12: Postersitzung (Struktur und Dynamik reiner Oberfl
ächen, Grenzfl
äche fest-flüssig, Nanostrukturen, Teilchen und Cluster, Halbleiteroberfl
ächen und Grenzfl
ächen, Zeitaufgelöste Spektroskopie, Rastersondentechniken, Methodisches)

O 12.43: Poster

Montag, 24. März 2003, 18:00–21:00, P1

CHARACTERIZATION OF ORGANIC SURFACES BY DYNAMIC FRICTION FORCE MICROSCOPY — •Alexander gigler, Sabine Hild, and Othmar Marti — Experimental Physics, University of Ulm, D-89069 Ulm, Germany

Dynamic Friction Force Microscopy (DFFM) is very useful when investigating local material parameters and it also overcomes the disadvantages of static Friction Force Microscopy (FFM): a) Influences on the local friction by topography. b) Destruction of features by lateral forces especially on very soft samples. c) Difficulties in investigation of samples that reveal low friction coefficients. So far, a modulation frequency of about 10 kHz and low amplitudes of about 5 nm in the lateral direction is applied to the samples. However, these excitation frequencies only cover velocities up to some millimeters per second, but realistic velocities, e.g. driving speeds at which I/O-heads of harddiscs are moving, are in a range of some meters per second. To reach these excitation velocities we use shear-piezos as tunable sources of excitation and quarzes for measurements at discrete frequencies. Therefore, the increase in velocity also increases the number of friction loops that can be captured at every point of the AFM image. The first experiments will be shown.