Regensburg 2004 – wissenschaftliches Programm
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DS: Dünne Schichten
DS 9: Dünnschichtanalytik II
DS 9.8: Vortrag
Montag, 8. März 2004, 17:00–17:15, HS 32
Impact of design parameters of coupled parallel beam X-ray mirrors and channel cut monochromators on divergence, beam width and monochromacy — •T. Holz1, D. Korytar2, and T. Böttger3 — 1AXO DRESDEN GmbH, Siegfried-Rädel-Str. 31, D-01809 Heidenau — 2Institute of Electrical Engineering, DTDS, Vrbovska 110, SK-92101 Piestany, Slowakia — 3Fraunhofer Institute for Material and Beam Technology (IWS), Winterbergstr. 28, D-01277 Dresden
Intensity and beam divergence in high resolution X-ray diffraction arrangements are mainly influenced by the quality of the surface shaping of parallel beam multilayer mirrors, when the beam is coupled into a channel cut monochromator.
First results of optimisation process of matching of divergence between multilayer and crystal monochromator are presented.
The resulting beam characteristics are deduced from rocking scan measurements and coupled Θ−2Θ scans of a silicon single crystal reflection.
Different modifications of V-cut beam compressing crystals are compared to standard symmetric channel cuts.
Based on the results achieved for Mo-Kα1 radiation which were presented at the APD-III (NIST, Gaithersburg, 2001) we want to give the appropriate solution with the highest Cu-Kα1 intensity to a user.