Regensburg 2004 – wissenschaftliches Programm
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SYLS: Life Sciences on the Nanometer Scale - Physics Meets Biology
SYLS 3: Symposium "Life Sciences on the Nanometer Scale - Physics Meets Biology"
SYLS 3.49: Poster
Mittwoch, 10. März 2004, 16:00–18:30, B
Infrared ellipsometry for studying membrane protein films — •M. Gensch1, K. Hinrichs1, J. Heberle2, N. Esser1, E.H. Korte1, and A. Röseler1 — 1Institut für Spectrochemie und Angewandte Spektroskopie - Institutsteil Berlin, Albert-Einstein-Str. 9, D-12489 Berlin — 2Forschungszentrum Jülich, IBI-2: Structural Biology, D-52425 Jülich
Infrared ellipsometry is a standard method for the determination of the thickness and the optical constants of thin films in the mid infrared spectral range [1]. In the case of anisotropic films (e.g. membrane protein films) iterative best-fit calculations based on layer models and classical electromagnetic theory are applied to derive the anisotropic optical constants. The macroscopic properties of membrane protein films (e.g. roughness, varying thickness) generally do not meet the idealized conditions assumed in the layer models, which makes the determination of absolute values for the optical constants particulary difficult. Different approaches are presented for the determination of the anisotropic optical constants of membrane protein films using infrared ellipsometry and cooperative methods. [1] A. Röseler, E.H. Korte, No-dqInfrared spectroscopic ellipsometryNo-dqin: P.R. Griffiths, J. Chalmers (eds), Handbook of vibrational spectroscopy, Wiley. Chichester (2001) , chap 2.8