Berlin 2005 – wissenschaftliches Programm
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CPP: Chemische Physik und Polymerphysik
CPP 29: POSTER: Polymer physics
CPP 29.20: Poster
Dienstag, 8. März 2005, 16:30–18:30, Poster TU D
Modification and imaging of surface charges on polymers using atomic force microscopy — •Andreas Kleiner1, Sabine Hild1, Othmar Marti1, Armin Knoll2, Bernd Gotsmann2, Urs Dürig2, and Johannes Windeln2 — 1Dept. of Experimental Physics, University of Ulm, 89069 Ulm — 2IBM Research GmbH, Zurich Research Laboratory, CH-8803 Rüschlikon
The atomic force microscope (AFM) is widely used to investigate and modify mechanical properties of thin polymer films. Different static and dynamic modes like force curve measurements, Pulsed Force Mode or intermittent contact techniques apply certain amounts of normal and lateral forces to the sample. This implies the possibility to create surface charges, similar to the macroscopic contact electrification of insulators. These charges can be imaged in the ’Surface Potential’ or ’Kelvin Probe Force’ mode of the AFM. The quantity of charge depends on parameters like contact time, force or velocity. By an additional tip voltage during contact, the amount and polarity of the surface charges can be influenced. The long-term stability of these charges, measured on different polymers, will be also shown in this work.