Regensburg 2007 – wissenschaftliches Programm
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 13: Polymer Physics IV: Thin Films
CPP 13.6: Vortrag
Dienstag, 27. März 2007, 16:15–16:30, H40
Investigation of Polymer Surfaces by Dynamic Force Spectroscopy — •Jan-Erik Schmutz1,2 and Hendrik Hölscher1,2 — 1CeNTech, Heisenbergstr. 11, 48149 Münster — 2University of Münster, Wilhelm-Klemm-Str. 10, 48149 Münster
The atomic force microscope (AFM) is often used in dynamic modes to enhance the resolution compared to the conventional contact mode. The tapping mode where the cantilever is oscillating with a fixed frequency near the sample surface is the standard mode used in air and liquids.
With a slight modification of the excitation it is possible to gain more information about the sample surface. This so-called constant-excitation mode (CE-mode) enables the direct and continous determination of conservative and dissipative tip-sample interactions [1].
Recently, we demonstrated the application of this technique to self-organizing DPPC films [2] which are frequently used as model systems for biological membranes. Beside a comparable resolution to the tapping mode this technique also gives quantitative information about the material properties like adhesion force and contact stiffness.
Here we apply this technique to the copolymers acrylonitrile butadiene styrene (ABS) and styrene butadiene styrene (SBS).
The advantages of the CE-mode compared to the tapping mode will be discussed.
H. Hölscher, B. Anczykowski, Surf. Sci. 579, 21 (2005)
J.-E. Schmutz, M.M. Schäfer, H. Hölscher (submitted)