Berlin 2008 – wissenschaftliches Programm
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DF: Fachverband Dielektrische Festkörper
DF 9: Poster
DF 9.15: Poster
Dienstag, 26. Februar 2008, 15:00–18:00, Poster G
Interfacial ion conduction in nanostructured solid electrolytes measured by Electrostatic force microscopy — •Ahmet Taskiran1, Andre Schirmeisen1, Bernhard Roling2, and Bracht Hartmut3 — 1Physikalisches Institut,Wilhelm-Klemm-Str.10,48149 Münster,Germany — 2Institut für Phys.Chemie,Hans-Meerwein-Str.,35032 Marburg,Germany — 3Institut für Materialphysik, Wilhelm-Klemm-Str.10,48149 Münster,Germany
Solid ion conductors are applied in super-capacitors, high energy storage batteries and chemical sensors. Recent work has shown an enhancement of the overall conductivity by interfaces between different materials. Since the macros. measurements yield an average value over a large regime, an investigation on nanoscopic scale is needed to understand the ion dynamic. We use electrostatic force microscopy (EFM) operating in the noncontact mode, which use a sharp tip with an apex radius of 10 nm as measuring sensor. Therefore, the investigations of ion transport occur in nanoscopic volume. The investigation of temperature dependent ion conductivity was monitored in the range from 100-675 K, yielding the activation energies of the ion hopping process [1]. We measured the activation energies of nanocrystallites as well as the glass matrix in a partially crystallized LiAlSiO sample, which are in good agreement with macroscopic results [2] and identified an additional activation energy which can be attributed to the ions at the interface between both phases [3].[1]Schirmeisen et al.,Appl. Phys. Lett.85(2004)2053 [2]Roling et al.,Phys.Chem.Chem.Phys.7(2005)1472 [3]Schirmeisen et al.,Phys.Rev.Lett.98(2007)225901