Berlin 2008 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 12: Thin Film Characterisation: Structure Analyse and Composition (XRD, TEM, XPS, SIMS, RBS, ...)
DS 12.3: Vortrag
Dienstag, 26. Februar 2008, 12:15–12:30, H 2013
Surface sensitive analysis of YBCO thin films — •Tetyana Shapoval, Sebastian Engel, Elke Backen, Dagmar Meier, Marina Gründlich, Ulrike Wolff, Volker Neu, Bernhard Holzapfel, and Ludwig Schultz — IFW Dresden, Institute for Metallic Materials, P.O. Box 270116, D-01171 Dresden, Germany
Successful cleaning and polishing of a set of YBa2Cu3O7−δ (YBCO) thin films prepared by Pulsed Laser Deposition (PLD) and Chemical Solution Deposition (CSD) have been performed. The roughness of the films was reduced to a value of less than 5 nm, which opens a way to apply local surface sensitive techniques even on formerly very rough samples (some hundred nm peak-to-valley) such as CSD YBCO films. As one application flux lines of YBCO films were imaged with the Omicron Cryogenic SFM in MFM mode.
The knowledge about geometry and distribution of artificial nanodefects in the interior of the film is crucial for further improvement of superconducting properties of these materials. The above mentioned polishing procedure has been further developed to prepare smooth low angle wedges of such samples. This offers the possibility to obtain depth dependent information with different surface sensitive scanning techniques. A high resolution electron backscattered diffraction image on the polished wedge of CSD YBCO sample reveals the homogeneous distribution of non superconducting BaHfO3 nanoparticles in the whole volume of the film.