Berlin 2008 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 15: Functional Oxides

DS 15.5: Vortrag

Dienstag, 26. Februar 2008, 16:15–16:30, H 2032

Laser-assisted deposition and element analysis of nano-composite oxide thin films — •Johannes Pedarnig^1,2, Johannes Heitz^1,2, Thomas Stehrer^1,2, Bernhard Praher^1,2, Richard Viskup^1,2, Khurram Siraj², Andreas Moser², Angela Vlad², Marius Bodea², Dieter Bäuerle², N. Hari Babu³, and David Cardwell³ — ¹Christian Doppler Laboratory for Laser-Assisted Diagnostics, — ²Institute of Applied Physics, Johannes Kepler University Linz, A-4040 Linz, Austria — ³Department of Engineering and IRC in Superconductivity, University of Cambridge,

Functional oxide thin films are epitaxially grown by pulsed-laser deposition (PLD) method. High-Tc superconducting (HTS) films of enhanced critical current density Jc are deposited by laser ablation of YBa₂Cu₃O₇ (Y-123) ceramics containing Y₂Ba₄CuMO_x (M-2411, M = Ag, Nb, Ru, Zr) nano-particles. The Jc enhancement of nano-composite films depends on the secondary phase content of the ceramic targets. Piezoelectric oxides such as novel GaPO₄ and ZnO doped with Lithium and Aluminum are grown as thin films and double-layers.

The monitoring of deposition processes and the element analysis of layers and ceramics are performed by laser-induced break down spectroscopy (LIBS). The LIBS signals recorded in situ are stable for more than 10000 laser pulses employed for target ablation. The relative element concentration in thin films and ceramics is the same demonstrating stoichiometric ablation and transfer of the multi-component oxide materials.