Berlin 2008 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 17: Poster: Trends in Ion Beam Technology, Magnetism in Thin Films, Functional Oxides, High-k Dielectric Materials, Semiconductor Nanophotonics, Nanoengineered Thin Films, Layer Deposition Processes, Layer Growth, Layer Properties, Thin Film Characterisation, Metal and Amorphous Layers, Application of Thin Films

DS 17.38: Poster

Dienstag, 26. Februar 2008, 09:30–13:30, Poster A

Electromigration in Silver Nanowires — •Christian Wirtz, Niemma Buckanie, Frank-Joachim Meyer zu Heringdorf, and Günter Dumpich — Universität Duisburg-Essen , Fachbereich Physik, Lotharstrasse 1 , 47048 Duisburg

We observe electromigration in silver nanowires by in-situ scanning electron microscopy. Single-crystalline nanowires are prepared employing a self-organised growth process, polycrystalline wires by electron beam lithography (EBL). These nanowires are contacted by voltage and current leads, also using an EBL technique. Electromigration is then induced applying current densities in the range of 10⁸ A/cm² in either two- or four-terminal mode. Under these conditions, the single-crystalline silver nanowires exhibit a direction of mass flow opposed to that found in their polycrystalline counterparts. This effect is currently believed to originate from surface diffusion effects and to be intimately related to the direct force exerted on the ion cores by the electric field. Further research efforts will comprise investigation of irradiated single-crystals and the role of disorder in electromigration processes. This work is supported by the DFG (SFB 616).