Berlin 2008 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 36: Vibrational Spectroscopy of Nanolayers with Optical Probes
DS 36.1: Hauptvortrag
Freitag, 29. Februar 2008, 10:15–10:45, H 2013
Infrared ellipsometry on functional films at the solid-liquid-interface — •Karsten Hinrichs — ISAS - Institute for Analytical Sciences, Department Berlin, Albert-Einstein-Str. 9, 12489 Berlin, Germany
Organic/silicon hybrid systems are of high technological relevance for design of optical, electronic, biosensing and photovoltaic devices. Infrared spectroscopic ellipsometry (IRSE) was applied for in-situ monitoring of structural properties at the interface between silicon/film and liquid. Several examples with a few nm thick films at the solid-liquid interface will be discussed: 1) Etching process of anodic silicon oxide in diluted NH4F solution; 2) The study of the switching behavior of stimuli-responsive mixed polymer brushes [1]; 3) The growth of electrochemically prepared organic films (e.g. polypyrrole, nitrobenzene).
[1] Y. Mikhaylova, L. Ionov, J. Rappich, M. Gensch, N. Esser, S. Minko, K.-J. Eichhorn, M. Stamm, K. Hinrichs, Analytical Chemistry 79 (2007) 7676.