Berlin 2008 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 21: Magnetic Thin Films II
MA 21.5: Vortrag
Mittwoch, 27. Februar 2008, 15:00–15:15, H 1012
Interface magnetic properties of Al/Heusler films investigated by XAS and XMCD — •Michael Kallmayer1, Kerstin Hild1, Tobias Eichhorn1, Horst Schneider1, Gerhard Jakob1, Andres Conca1, Martin Jourdan1, Hans-Joachim Elmers1, Andrei Gloskovskii2, Stefan Schuppler3, and Peter Nagel3 — 1Johannes Gutenberg-Universität Mainz, Institut für Physik, D-55099 Mainz — 2Johannes Gutenberg-Universität Mainz, Institut für Anorganische und Analytische Chemie, D-55099 Mainz — 3Forschungszentrum Karlsruhe, Institut für Festkörperphysik, D-76021 Karlsruhe
The magnetic interface properties of Heusler alloys often deviate from bulk properties, but they greatly determine the functionality of Heusler films in devices. We have investigated magnetic interface properties of Co2Cr0.6Fe0.4Al, Co2FeSi and Ni2MnGa films that are capped by an Al layer. X-ray absorption spectroscopy (XAS) reveals a considerable interdiffusion of Al into the Heusler film at elevated temperatures and even at rough interfaces at 320 K. This explains a decreased interface magnetization as observed by x-ray magnetic circular dichroism (XMCD) [1]. Microspectroscopy using photoemission electron microscopy reveals that the reaction proceeds inhomogeneously with reaction nuclei separated on a micron length scale [2].
[1] M.Kallmayer et al., J.Phys.D: Appl.Phys. 40 (2007) 1552.
[2] M.Kallmayer et al., Appl.Phys.Lett. 91 (2007) 192501.