Berlin 2008 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 32: Postersession II: Spinstruct./Phase Trans. (1-10); Spinelectronics (11-15); Thin Films (16 - 36); Particles/Clusters (37-45); Multiferroics (46-54); Spindynamics/Spin Torque (55 - 76); Post Deadlines (77-79)
MA 32.27: Poster
Freitag, 29. Februar 2008, 11:15–14:00, Poster E
Magnetic phase transitions at interfaces studied by resonant magnetic soft x-ray scattering — •Enrico Schierle1, Detlef Schmitz1, Gunther Springholz2, and Eugen Weschke1 — 1Hahn-Meitner-Institut , Berlin, Germany — 2Institut für Halbleiterphysik, Johannes Kepler University, Linz, Austria
Properties of magnetic thin films are strongly influenced by the near-interface regions, where modifications of bulk magnetic order [1] and roughness occur. Using resonant magnetic soft x-ray scattering at the Eu-M5 resonance, we studied the temperature-dependent magnetization of the individual layers in monocrystalline films of the magnetic semiconductor EuSe with thicknesses of 20 and 40 monolayers. These films exhibit AFM, ferri- (FiM) and FM phases depending on temperature and applied magnetic field [2]. Due to the high magnetic sensitivity at resonance [3], very intense AFM and FiM Bragg peaks could be recorded that are characterized by pronounced Laue oscillations over a large range of momentum transfer. These permit a detailed characterization of temperature-dependent interface-induced disorder for different types of magnetic structures (AFM, FiM) in a single material. Preliminary analyses point to a much stronger influence of the interface on the FiM structure than on AFM order.
[1] K. Binder, P. C. Hohenberg, Phys. Rev. B 9, 2194 (1974)
[2] R. T. Lechner et al., Phys. Rev. Lett. 94, 157201 (2005)
[3] E. Weschke et al., Phys. Rev. Lett. 93, 157204 (2004)