Berlin 2008 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 32: Postersession II: Spinstruct./Phase Trans. (1-10); Spinelectronics (11-15); Thin Films (16 - 36); Particles/Clusters (37-45); Multiferroics (46-54); Spindynamics/Spin Torque (55 - 76); Post Deadlines (77-79)
MA 32.77: Poster
Freitag, 29. Februar 2008, 11:15–14:00, Poster E
Exchange coupling in Fe/NiO bilayers grown on vicinal Ag(001) surface — Yizheng Wu1,2, Jia Li1,2, Xiuli Fu1, Fikret Yildiz1, Xiaodong Ma1, •Marek Przybylski1, and Jürgen Kirschner1 — 1Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle, Germany — 2Department of Physics, Fudan University, Shanghai, China
Exchange bias is known as a magnetic coupling phenomenon at ferromagnetic (FM) - antiferromagnetic (AFM) interfaces with strong implications for magnetic field sensor applications, read heads, and modern approaches to spintronics. For complete understanding of the physical origin of the exchange bias, it requires the capability to measure and manipulate the anisotropy of the AFM spins. For example, different out-of-plane anisotropy is reported for AFM films grown on different substrates. We found that the in-plane anisotropy can be tailored by atomic steps if growing the AFM films on a stepped surface. We report on the exchange coupling in Fe/NiO bilayers grown on a Ag(10,1,1) surface with 8o vicinal angle. The step induced anisotropy in the NiO film was confirmed by XMLD technique. MOKE measurements show that there is perpendicular coupling between Fe and NiO spins. The magnetic anisotropy in the NiO film makes the exchange bias strongly dependent on the cooling field direction. The magnetization of Fe films tilts by a small angle out of the surface plane when the film is grown on a Ag vicinal surface. Placing an antiferromagnetic NiO layer between the Fe film and the Ag(10,1,1) substrate further forces the Fe spins to be oriented away from the surface plane.