Berlin 2008 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 36: Surfaces and Films: Forces, Structure and Manipulation
O 36.2: Vortrag
Dienstag, 26. Februar 2008, 14:30–14:45, MA 041
Force measurement with a scanning tunneling microscope — •Kai-Felix Braun1,2 and Saw-Wai Hla2 — 1Physikalisch Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig — 2Clippinger Laboratories, Ohio University, Athens, Ohio 45701, USA
We present a method to measure the interaction force between single atoms with a scanning tunneling microscope [1]. During experiments for atomic manipulation with a scanning tunneling microscope the tip height curve is recorded. It is shown here that the amplitude of the manipulation curve is a measure for the interaction force between the microscopes tip and a single atom adsorbed on a surface. A simple formula is derived and tested. Extensions of this scheme to different surfaces shall be discussed.
[1] K.-F. Braun and S.W. Hla, Physical Review B 75 (2007), 033406