Berlin 2008 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 77: Methods: Scanning Probe Techniques I
O 77.6: Vortrag
Donnerstag, 28. Februar 2008, 16:45–17:00, MA 041
Frequency Modulation Atomic Force Microscopy and Spectroscopy on DPPC in Liquid — •Daniel Ebeling1,2, Hendrik Hölscher1,2, and Boris Anczykowski3 — 1Center for Nanotechnology (CeNTech), Heisenbergstr. 11, 48149 Münster — 2Physikalisches Institut, Wilhelm-Klemm-Str. 10, 48149 Münster — 3nanoAnalytics GmbH, Heisenbergstr. 11, 48149 Münster
The application of dynamic force spectroscopy in vacuum allows the mapping of tip-sample forces down to the atomic-scale. However, it has been shown that dynamic force spectroscopy works also in ambient conditions [1] and liquids [2] enabling the precise measurement of tip-sample forces. By adding a Q-Control electronics to the set-up of the constant-excitation mode of the frequency-modulation atomic force microscope we are able to increase the effective Q-factor of a self-oscillated cantilever in liquid to values comparable to ambient conditions [3]. During imaging of a DPPC bilayer on a mica substrate we observed an increased corrugation of the topography with increased Q-factors. This effect is caused by the reduction of tip-sample indentation forces [4]. Furthermore, dynamic force spectroscopy allows to measure the tip-sample forces and can be used as a powerful tool to determine the mechanical properties of the DPPC bilayer.
H. Hölscher and B. Anczykowski. Surf. Sci. 579, 21 (2005).
T. Uchihashi et al., Appl. Phys. Lett. 85, 3575 (2004).
D. Ebeling, H. Hölscher, B. Anczykowski, Appl. Phys. Lett. 89, 203511 (2006).
D. Ebeling and H. Hölscher, J. Appl. Phys (accepted).