O 77: Methods: Scanning Probe Techniques I
Thursday, February 28, 2008, 15:30–17:30, MA 041
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15:30 |
O 77.1 |
Advanced Spherical Probes for Atomic Force Microscopy — •Jan-Erik Schmutz, Marcus M. Schäfer, and Hendrik Hölscher
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15:45 |
O 77.2 |
Detection of Ferroelectric Domain Boundaries with Lateral Force Microscopy — Tobias Jungk, Akos Hoffmann, and •Elisabeth Soergel
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16:00 |
O 77.3 |
Evaluating Electrostatic Force Microscopies for the Investigation of Near-Surface Dopant Distribution in Silicon — •Markus Ratzke, Mario Birkholz, Joachim Bauer, Detlef Bolze, and Juergen Reif
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16:15 |
O 77.4 |
Fe/W(001) - a structurally, electronically and magnetically inhomogeneous system studied by force microscopy — •Rene Schmidt, Ung Hwan Pi, Alexander Schwarz, and Roland Wiesendanger
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16:30 |
O 77.5 |
Resolution improvement for mid infrared nearfield optical microscopy through gold nanoparticle scatterers — •Marc Tobias Wenzel, Susanne C. Schneider, Lukas M. Eng, Stephan Winnerl, and Manfred Helm
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16:45 |
O 77.6 |
Frequency Modulation Atomic Force Microscopy and Spectroscopy on DPPC in Liquid — •Daniel Ebeling, Hendrik Hölscher, and Boris Anczykowski
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17:00 |
O 77.7 |
Metal cross–substitution in the misfit layer compound (PbS)1.13TaS2 — •Matthias Kalläne, Hans Starnberg, Kai Roßnagel, Martin Marczynski-Bühlow, Sven Stoltz, and Lutz Kipp
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17:15 |
O 77.8 |
Plan view and UHV-cross-sectional STM of GaN structures — •David Krüger, Thomas Schmidt, Stephan Figge, Detlef Hommel, and Jens Falta
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