Berlin 2008 – wissenschaftliches Programm
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TT: Fachverband Tiefe Temperaturen
TT 17: Matter at Low Temperature: Measuring Devices, Cryotechnique
TT 17.1: Vortrag
Dienstag, 26. Februar 2008, 14:00–14:15, H 2053
First Results of the Resonant Inelastic X-Ray Scattering Station at the ADRESS Beamline at the Swiss Light Source — •Thorsten Schmitt1, Vladimir Strocov1, Giacomo Ghiringhelli2, Andrea Piazzalunga2, Xiaoqiang Wang3, Justina Schlappa1, Claudia Dallera2, Lucio Braicovich2, Marco Grioni3, and Luc Patthey1 — 1Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland — 2Politecnico di Milano, Italy — 3EPFL Lausanne, Switzerland
Resonant inelastic X-ray scattering (RIXS) is a powerful bulk-sensitive probe of the electronic structure of condensed matter with atomic and orbital sensitivity. It is an unique tool for determining the energy and symmetry of charge neutral electronic excitations (e.g. crystal field or spin-flip excitations) in strongly correlated materials. The ADvanced RESonant Spectroscopies (ADRESS) beamline at the Swiss Light Source (SLS) features advanced instrumentation for RIXS. This year it will be complemented by instrumentation for Angle-Resolved Photoelectron Spectroscopy. The RIXS station is equipped with a spectrometer (resolving power ≈ 12000 for 1 keV) so-called SAXES (Super Advanced X-ray Emission Spectrograph) based on a variable line spacing spherical grating. The RIXS station is open since spring 2007 and was undergoing the operation tests during the 2nd half of 2007. We report on first results obtained with RIXS on transition metal monoxides (NiO, MnO and CuO) as reference compounds. These results demonstrate the capability of this set-up for RIXS studies on strongly correlated materials with unprecedented ultra-high resolution.