Berlin 2008 – wissenschaftliches Programm
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TT: Fachverband Tiefe Temperaturen
TT 7: Matter at Low Temperature: Poster Session
TT 7.8: Poster
Montag, 25. Februar 2008, 14:00–18:00, Poster B
High resolution X-ray diffraction and surface/interface scattering beamline NANO coming up in 2009 at ANKA — •Thorsten Schwarz1, Sondes Bauer1, and Tilo Baumbach1,2 — 1Institut für Synchrotronstrahlung / ANKA, Forschungszentrum Karlsruhe, 76021 Karlsruhe — 2Laboratorium für Applikationen der Synchrotronstrahlung, Universität Karlsruhe, 76128 Karlsruhe
NANO at ANKA is a future synchrotron beamline on a superconducting undulator source, specialized on high-resolution x-ray diffraction, surface and interface X-ray scattering investigations. The beamline optic has been optimized to deliver a monochromatic and highly collimated beam with sufficient flux to investigate the structure changes and the strain evolution during the growth of epitaxial films and superlattices. In order to carry out real time measurements, different types of environmental chambers, e.g., for molecular beam epitaxy, will be mounted on a heavy duty diffractometer which could support up to 500 kg. It rotates the sample and the environmental parts in all directions in space. With two different detection systems on the diffractometer, it is possible to perform two measurements simultaneously: like Grazing Incidence Small Angle X-ray Scattering (GISAXS) to determine the shape, size, position and correlation in nanostructures and Grazing Incidence Diffraction (GID) to characterize the surface-patterned structure. One of the main issues of the beamline is to study the interface properties like roughness and correlation even for less scattered materials like organic semi-conductors. For that reason, it will be possible to use a multilayer monochromator to get two orders of magnitude more flux with an energy resolution of 1