Dresden 2009 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)
O 27.13: Poster
Dienstag, 24. März 2009, 18:30–21:00, P2
Non-contact Atomic Force Spectroscopy using Field Ion Microscope characterized Tips — •Jens Falter1, Daniel-Alexander Braun1,2, Udo Schwarz4, Hendrik Hölscher3, André Schirmeisen1,2, and Harald Fuchs1,2 — 1Physikalisches Institut, Universität Münster, Germany — 2CeNTech, Münster, Germany — 3IMT, Forschungszentrum Karlsruhe, Germany — 4Department of Mechanical Engineering, Yale University, New Haven, USA
Although atomic force microscopy (AFM) is a tool for resolving surfaces with atomic resolution, the underlying contrast mechanisms is not yet fully understood. Beyond imaging this technique is capable to measure the interaction potential of tip and sample atoms in force spectroscopy experiments. What remains completely unknown is the atomic scale configuration of the tip. One method which allows determining the configuration of the probing tip apex with atomic precision is the field ion microscope (FIM). We present a home-build ultrahigh vacuum system, which combines these two microscopy techniques. The AFM head [1] is capable to operate at liquid helium temperatures and the force sensor is based on a tuning fork system [2]. The tuning fork concept allows to chose a material for the tip, which is suitable for FIM operation. A home build tip-holder is used for the in-situ tip exchange between the two microscopes. First results of both microscopy methods correlate the force spectroscopy curves from the AFM with the tip apex radii obtained from the FIM analysis.
[1] B.Albers et al., Rev. Sci Instrum. 79 033704 (2008)
[2] F.J.Giessibl, Appl. Phys. Lett. 76 1470 (2000)