Dresden 2009 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)
O 27.4: Poster
Dienstag, 24. März 2009, 18:30–21:00, P2
Controlled Atmosphere High Temperature SPM for electrochemical measurements — •Nils Ohmer1, Mogens Mogensen1, Bjørn Johansen1, and Torben Jacobsen2 — 1Fuel Cells and Solid State Chemistry Division, Risø National Laboratory for Sustainable Energy, DTU, DK-4000 Roskilde, Denmark. — 2Department of Chemistry, Technical University of Denmark, DK-2800 Lyngby, Denmark.
The Controlled Atmosphere High Temperature Scanning Probe Microscope (CAHT-SPM) works in principle like a normal AFM, but makes it possible to take, additional to the topography images, electrical images at the same time and at temperatures of up to 800 °C in a controlled atmosphere. Furthermore it is possible to use the tip as a working electrode to perform electrochemical impedance measurements at selected points. This poster provides information about the set up of the CAHT-SPM, in-house-made probes for electrical measurements at high temperatures and some results of measurements at 650 °C.