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Dresden 2009 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)

O 27.6: Poster

Dienstag, 24. März 2009, 18:30–21:00, P2

Force-field spectroscopy on KBr(001): Experiment and simulation — •Kai Ruschmeier1, André Schirmeisen1, and Regina Hoffmann21Physikalisches Institut, Westfälische Wilhelms-Universität Münster and Center for Nanotechnology (CeNTech), 48149 Münster, Germany — 2Physikalisches Institut and DFG-Center for Functional Nanostructures, Universität Karlsruhe, 76128 Karlsruhe, Germany

An atomic force microscope (AFM) is capable of imaging the surface of insulating samples with atomic precision by scanning an atomically sharp tip over the surface. Furthermore, the force field representing the spatial orientation and magnitude of the force acting between the AFM probe and the sample surface can be measured by force field spectroscopy. These measurements depend on the respective sample atoms but also crucially on the particular tip structure and material.

We compare force field measurements on KBr(001) at room temperature with atomistic simulations for two individual tip configurations, a K+- and a Br-terminated tip, assuming that the tip was contaminated with sample material during the experiments [1]. The 2-dimensional force fields were obtained at two different sample positions: along the corrugation maxima and almost halfway between the corrugation maxima and minima. We find good agreement between our measurements and simulations for the K+-terminated tip for both sample positions confirming a previous analysis [2].

[1] R. Hoffmann et al., Phys. Rev. Lett. 92, 146103 (2004).

[2] K. Ruschmeier et al., Phys. Rev. Lett. 101, 156102 (2008).

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