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A: Fachverband Atomphysik
A 2: Interaction with VUV and X-Ray Light I
A 2.3: Vortrag
Montag, 2. März 2009, 11:45–12:00, VMP 6 HS-E
Jitter-compensated time-resolved ion spectrometry at FLASH — •Maria Krikunova1, Theophilos Maltezopoulos1, Armin Azima1, Moritz Schlie1, Ulrike Frühling2, Patrick Rüdiger1, Harald Redlin2, Roland Kalms1, Marek Wieland1, and Markus Drescher1 — 1Institut für Experimentalphysik, Universität Hamburg, Luruper Chausee 149, 22761 Hamburg, Germany — 2HASYLAB at DESY, Notkestrasse 85, 22607 Hamburg, Germany
Photoionisation of deep atomic shells creates inner vacancies followed by a complex sequence of multi-electron relaxation processes via transient states. Recent XUV-pump/laser-probe ion spectrometry experiments using a HHG source allowed real time studies of electron relaxation dynamics in noble gas atoms. The much higher intensity of XUV pulses from the Free electron LASer in Hamburg (FLASH) holds out the prospect of extending this technique to more dilute species. This, however, calls for an improvement of the temporal resolution. Currently, the XUV/laser timing is subject to a jitter of a few hundred fs. In order to compensate for these fluctuations, we have developed a correlation technique based on XUV-induced reflectivity changes on a semiconductor surface. Applying this tool, we were able to perform a jitter-compensated time resolved ion-spectrometry experiment, identifying intermediate state dynamics in Xe atoms upon excitation of the 4d-shell with 93 eV XUV pulses and probing with 400 nm laser pulses. The results of this study reveal the current temporal resolution limit of pump-probe experiments utilizing XUV- and laser pulses from FLASH.