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A: Fachverband Atomphysik
A 26: Atomic Clusters III
A 26.1: Hauptvortrag
Donnerstag, 5. März 2009, 14:00–14:30, VMP 6 HS-B
X-ray spectroscopy in an ion trap: doped semiconductor cages, transition metal molecules, and water clusters — •Tobias Lau1, Konstantin Hirsch1, Philipp Klar1, Andreas Langenberg1, Fabian Lofink1, Jürgen Probst1, Robert Richter1, Jochen Rittmann1, Marlene Vogel1, Vicente Zamudio-Bayer1, Bernd von Issendorff2, and Thomas Möller1 — 1Technische Universität Berlin, Institut für Optik und Atomare Physik, EW 3-1, Hardenbergstraße 36, D-10623 Berlin — 2Universität Freiburg, Fakultät für Physik, Stefan-Meier-Straße 21, D-79104 Freiburg
With the development of ion traps for core level excitation, X-ray absorption spectroscopy on size-selected gas phase clusters has come into reach. For the first time, local electronic properties of isolated clusters and nanoparticles can be accessed with element specificity. For doped semiconductor clusters, XAS provides the key to understanding the electronic structure and the nature of bonding, elucidating electronic shells in highly symmetric cages. In transition metal dimers, core level excitation revealed atomic localization of 3d valence electrons in Cr2+, Mn2+, and CrMn+ dimers. In protonated water clusters, hydrogen bonding is studied via oxygen 1s excitation. Very recently, even direct core-level photoionization could be accessed in silicon and aluminum clusters. We will give an overview of the experimental technique and present highlights from recent results.