Regensburg 2010 – wissenschaftliches Programm
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 11: Poster: New Instruments and Methods
CPP 11.4: Poster
Montag, 22. März 2010, 16:30–18:00, Poster C
Simultaneous investigation of morphological characteristics and crystallinity of thin nanocomposite films — •Jan Perlich1, Jan Rubeck1, Peter Müller-Buschbaum2, Stephan V. Roth1, and Rainer Gehrke1 — 1HASYLAB at DESY, Hamburg — 2TU München, Physik-Department LS E13, Garching
Thin nanocomposite films formed by polymer or colloidal templates consisting of various material systems are employed in many fields such as coatings, sensors, photovoltaics, catalysis, magnetic recording and biomimetics. The preparation techniques enable the fabrication of thin films with tailor-made morphologies and specific properties. In order to correlate the characteristics of the fabricated thin films with the employed parameter settings at preparation, a detailed characterization is necessary. The simultaneous investigation of the morphological characteristics as well as the crystallinity of thin, crystalline metal oxide films is performed by small and wide angle X-ray scattering at grazing incidence (GISAXS and GIWAXS/GIXD). The small angle scattering beamline BW4 of HASYLAB, as a dedicated materials science beamline, is most suitable for such an investigation enabling the simultaneous access to an extended scattering q-range for GIWAXS. In addition, the introduction of a sample environment with defined environmental conditions, e.g. inert gas, heating and vapor treatment, enables in-situ observations of the thin nanocomposite films regarding several questions. Recent experimental data is presented and the X-ray scattering investigation is complemented in real space by surface and thin film sensitive probes.