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Regensburg 2010 – wissenschaftliches Programm

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 31: Poster: Polymer Dynamics

CPP 31.13: Poster

Mittwoch, 24. März 2010, 17:30–19:00, Poster C

Glassy dynamics in nanometer thin layers of polystyrene — •Emmanuel U. Mapesa1, Martin Treß1, Michael Erber2, Klaus-Jochen Eichhorn2, Brigitte Voit2, Anatoli Serghei3, and Friedrich Kremer11Universität Leipzig, Germany — 2Leibniz Institut für Polymerforschung, Dresden, Germany — 3University of Amherst, USA

Glassy dynamics in nanometer (5 nm - 200 nm) thin layers of polystyrene are studied by Broadband Dielectric Spectroscopy and spectroscopic Ellipsometry. For the dielectric measurements two types of sample arrangements were applied using either evaporated metal or doped silicon counter electrodes, the latter being accomplished with nanostructured highly insulating silica spacers. In both cases - within the experimental accuracy of +/- 2 K - no change in the mean relaxation rate and in the width of the relaxation time distribution function is observed. Coinciding results are obtained by the ellipsmetric measurements.

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