Regensburg 2010 – wissenschaftliches Programm
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 33: Poster: Charge Effects in Soft and Biological Matter
CPP 33.2: Poster
Mittwoch, 24. März 2010, 17:30–19:00, Poster C
X-Ray and Neutron Reflectometry Study of Polyelectrolyte Multilayers under Mechanical Stress — •Johannes Früh1, Adrian Rühm2, Rumen Krastev1,3, and Ralf Köhler1,4 — 1MPI für Kolloid- und Grenzflächenforschung, Am Mühlenberg 1, 14424 Potsdam, Germany — 2MPI für Metallforschung, Heisenbergstraße 3, 70569 Stuttgart, Germany — 3Naturwissenschaftliches und Medizinisches Institut an der Universität Tübingen Markwiesenstraße 55, 72770 Reutlingen, Germany — 4Helmholtz-Zentrum Berlin, Lise Meitner Campus, Hahn-Meitner-Platz 1, 14109 Berlin, Germany
Polyelectrolyte (PE) multilayers (PEM) produced by layer-by-layer (LbL) self assembly technique find application in different fields of the technique. Often the PEM are exposed to mechanical stress which they have to sustain. This makes the studies on mechanical properties of PEM important. Especially interesting is the crossover of internal interactions of PE molecules on molecular level and their mechanical properties as their "macroscopic" representation. Our investigation focuses on the changes of the thicknesses and the roughnesses of thin PEM films when the film is exposed to uniaxial mechanical stress. The PEM were prepared from poly-styrene sulphonate (PSS) and poly-diallyldimethyl-ammonium chloride (PDDA) using LbL technique on sheets of homogeneous and molecularly flat poly-dimethylsiloxane (PDMS) and on glass slides as substrates. A modified reflectometry technique on the substrates was used to investigate the thickness changes of the PEM. The films exhibit ranges of elastic and plastic deformation according to the strength of the applied stress.