Regensburg 2010 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 5: Nanoengineered Thin Films

DS 5.2: Vortrag

Montag, 22. März 2010, 16:00–16:15, H8

Strain-dependent conductivity of granular metals prepared by focused particle beam induced deposition — •Christina Grimm¹, Markus Baranowski¹, Friedemann Völklein², and Michael Huth¹ — ¹Physikalisches Institut, Goethe-Universität, D-60438 Frankfurt am Main, Germany — ²Institut für Mikrotechnologien, Hochschule RheinMain, D-65428 Rüsselsheim, Germany

We report on the strain-dependence of the electrical conductivity of granular metals prepared by focused particle beam induced deposition. The samples were prepared in a dual-beam electron / Ga ion scanning microscope using selected precursors, such as W(CO)₆. Stripe-like deposits were fabricated on dedicated cantilevers pre-patterned with contact pads made from Cr/Au. The cantilever deflection was induced in-situ by means of a four axes nano-manipulator and the conductivity change was recorded by lock-in technique employing a Wheatstone resistance bridge. Current-voltage characteristics and strain-dependence were measured for samples of various thicknesses and composition. For selected samples time-dependent conductivity data were taken as the samples were slowly epxosed to air.