Regensburg 2010 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
MA: Fachverband Magnetismus
MA 33: Poster II
MA 33.42: Poster
Freitag, 26. März 2010, 11:00–14:00, Poster B1
High resolution magnetic imaging using scanning electron microscopy with polarization analysis — •Jakoba Heidler1, Daniel Rüffer1, Gregory Malinowski1, Jan Rhensius1,2, Laura Heyderman2, Stephen Krzyk1, and Mathias Kläui1 — 1Fachbereich Physik, Universität Konstanz, Germany — 2Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, Villingen, Switzerland
Scanning electron microscopy with polarization analysis is a powerful tool to investigate the spin structure in magnetic nanostructure by measuring the spin polarization of secondary electrons. In this poster, we will describe the SEMPA technique and present examples of measurements of the domains and domain wall spin structure in different magnetic nanostructures. For instance, we used SEMPA to image a domain wall displacement along a ferromagnetic nanowire, the domain configuration in NiFe disks and the change of spin polarization of a thin Co layer when changing the capping layer from Pt to Al2O3. All these measurements provide essential informations to understand the relationship between the domain wall configuration, the material spin polarization and the domain wall displacement in current induced domain wall motion experiements.