Regensburg 2010 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 26: Poster Session
MM 26.24: Poster
Dienstag, 23. März 2010, 14:45–16:30, Poster C
In-situ SEM tensile testing of single crystal Au nanowires — •Bahne Kapelle1, Gunther Richter2, and Cynthia A. Volkert1 — 1Institut für Materialphysik, Universität Göttingen — 2Max-Planck-Institut für Metallforschung, Stuttgart
The deformation behavior of nanoscale metals differs from that of bulk metals, showing in particular an increase in strength with decreasing size. The aim of this study is to determine the deformation process and strength of high quality single crystal Au nanowires using in-situ tensile testing in the SEM. Nanowires with diameters between 75 and 250 nm are mounted in a tensile setup using a micromanipulator and Pt deposition. The force on the wires is measured using a capacitive MEMS device during displacement controlled loading with a piezoelectric actuator. First results on a 180 nm diameter nanowire show homogeneous deformation up to ≈10% strain, followed by localized deformation and ductile rupture. Stress-strain curves and deformation morphologies for various diameter wires will be presented and interpreted in terms of in-situ TEM observations of dislocation activity obtained from the same wires in a separate study.