Regensburg 2010 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 22: Methods: Scanning probe techniques III

O 22.7: Vortrag

Dienstag, 23. März 2010, 12:00–12:15, H32

Magnetic Force Microscopy with a qPlus Sensor — •Maximilian Schneiderbauer and Franz J. Giessibl — Institute for Experimental and Applied Physics, Universität Regensburg, Universitätsstrasse 31, 93053 Regensburg, Germany

Magnetic Force Microscopy (MFM) plays an important role in investigating magnetic storage materials. Until now experiments were mainly performed with standard silicon cantilevers whose tips have been coated with ferromagnetic materials. Such cantilevers have a resonance frequency on the order of 200 kHz and spring constant k of about 20 N/m. This enables spatial resolution of approximately 15 nm. To prevent snap to contact from strong magneto static forces at closest separation one needs a much stiffer cantilever. The qPlus sensor with k approximately 2000 N/m is therefore a promising candidate for MFM measurements. In this talk preliminary results achieved with a qPlus based force sensor are presented.