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Regensburg 2010 – scientific programme

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O: Fachverband Oberflächenphysik

O 22: Methods: Scanning probe techniques III

Tuesday, March 23, 2010, 10:30–12:45, H32

10:30 O 22.1 Scanning Probe Microscopy with a Hydrogen atom — •Jay Weymouth, Thorsten Wutscher, and Franz Giessibl
10:45 O 22.2 Imaging surfaces with scanning tunneling hydrogen microscopy — •Christian Weiss, Stefan Tautz, and Ruslan Temirov
11:00 O 22.3 An atomic force microscope scanner for high speed, large range and high resolution imaging — •Christoph Braunsmann and Tilman Schäffer
11:15 O 22.4 AFM with Light-Atom Tip — •Thomas Hofmann, Joachim Welker, and Franz J. Gießibl
11:30 O 22.5 Simulations of metastable states near the apex of a KBr tip — •Regina Hoffmann and Alexis Baratoff
11:45 O 22.6 Advances in Quantitative Nanomechanical Mapping, and robust, user-friendly AFM tapping — •Johannes Kindt, Chanmin Su, Shuiqing Hu, and Bede Pittenger
12:00 O 22.7 Magnetic Force Microscopy with a qPlus Sensor — •Maximilian Schneiderbauer and Franz J. Giessibl
12:15 O 22.8 Observing a qPlus sensor oscillateJoachim Welker, •Alfred J. Weymouth, and Franz J. Giessibl
12:30 O 22.9 Dynamic Force Microscopy with Small Amplitudes at Ambient Conditions — •Elisabeth Köstner and Franz J. Gießibl
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