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DPG

Regensburg 2010 – scientific programme

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O: Fachverband Oberflächenphysik

O 3: Methods: Scanning probe techniques I

Monday, March 22, 2010, 11:15–13:00, H32

11:15 O 3.1 Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy — •Tobias Jungk, Florian Johann, Akos Hoffmann, and Elisabeth Soergel
11:30 O 3.2 SubSurface AFM: towards nondestructive 3D microscopy — •Gerard J. Verbiest, Johannes Simon, and Marcel J. Rost
11:45 O 3.3 Atomic-resolution force map measurements on single molecules — •Fabian Mohn, Leo Gross, Nikolaj Moll, Peter Liljeroth, and Gerhard Meyer
12:00 O 3.4 Interaction of the STM/AFM tip with graphite and graphene surfaces - theoretical models — •Martin Ondráček, Vít Rozsíval, and Pavel Jelínek
12:15 O 3.5 Searching for spin contrast on NiO with Ni tips — •Florian Pielmeier and Franz J. Giessibl
12:30 O 3.6 Challenges in constructing spin-polarized scanning probe tips — •Thorsten Wutscher and Franz J. Giessibl
12:45 O 3.7 Characterization of tips for spin-polarized scanning tunneling microscopyGuillemin Rodary, •Sebastian Wedekind, Hirofumi Oka, Dirk Sander, and Jürgen Kirschner
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