Regensburg 2010 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 41: Poster Session I (Semiconductor Substrates: Epitaxy and growth; Semiconductor Substrates: Adsorbtion; Semiconductor Substrates: Solid-liquid interfaces; Semiconductor Substrates: Clean surfaces; Oxides and insulators: Epitaxy and growth; Oxides and insulators: Adsorption; Oxides and insulators: Clean surfaces; Organic, polymeric and biomolecular films - also with adsorbates; Organic electronics and photovoltaics, Surface chemical reactions; Heterogeneous catalysis; Phase transitions; Particles and clusters; Surface dynamics; Surface or interface magnetism; Electron and spin dynamics; Spin-Orbit Interaction at Surfaces; Electronic structure; Nanotribology; Solid/liquid interfaces; Graphene; Others)
O 41.110: Poster
Dienstag, 23. März 2010, 18:30–21:00, Poster B1
Scanning tunneling microscopy (STM) studies of microsoldered graphene — •Alexander Georgi1, Anne Majerus1, Viktor Geringer1, Bart Szafranek2, Daniel Neumaier2, Marcus Liebmann1, and Markus Morgenstern1 — 1II. Physikalisches Institut, RWTH Aachen and JARA-FIT, Otto-Blumenthal-Straße, 52074 Aachen — 2Advanced Microelectronic Center Aachen (AMICA), Otto-Blumenthal-Straße 25, 52074 Aachen
Since STM is very susceptible to dirt, it is important to avoid contamination by prior processing. For graphene, we show that microsoldering [1] avoids dirt as resist, which has been found on lithographic samples. However, both samples show intrinsic corrugation with wavelength of 15 nm as previously reported for lithographically contacted graphene [2]. Ni deposition on the surface leads to clusters exhibiting spectroscopic features comparable to theoretical predictions [3]. Further measurements probing the properties of freely suspended graphene layers are presented.
Ç. Ö. Girit and A. Zettl, Appl. Phys. Lett. 91, 193512 (2007).
V. Geringer, M. Liebmann, T. Echtermeyer, S. Runte, M. Schmidt, R. Rückamp, M. C. Lemme and M. Morgenstern, Phys. Rev. Lett. 102, 76102 (2009).
P. A. Khomyakov, G. Giovannetti, P. C. Rusu, G. Brocks, J. van den Brink, and P. J. Kelly, Phys. Rev. B 79, 195425 (2009).