Regensburg 2010 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 41: Poster Session I (Semiconductor Substrates: Epitaxy and growth; Semiconductor Substrates: Adsorbtion; Semiconductor Substrates: Solid-liquid interfaces; Semiconductor Substrates: Clean surfaces; Oxides and insulators: Epitaxy and growth; Oxides and insulators: Adsorption; Oxides and insulators: Clean surfaces; Organic, polymeric and biomolecular films - also with adsorbates; Organic electronics and photovoltaics, Surface chemical reactions; Heterogeneous catalysis; Phase transitions; Particles and clusters; Surface dynamics; Surface or interface magnetism; Electron and spin dynamics; Spin-Orbit Interaction at Surfaces; Electronic structure; Nanotribology; Solid/liquid interfaces; Graphene; Others)

O 41.52: Poster

Dienstag, 23. März 2010, 18:30–21:00, Poster B1

Homogeneity and catalytic activity of thin mesoporous Au/TiO₂ layers — •Matthias Roos, Menhild Eyrich, Gabriela Kucerova, Joachim Bansmann, and R. Jürgen Behm — Institute of Surface Chemistry and Catalysis, Ulm University, D-89069 Ulm, Germany

Structurally defined thin layers of homogeneous mesoporous Au/TiO₂ are investigated as model systems to bridge the gap between planar Au/TiO₂ model and powder catalysts. The dispersed mesoporous Au/TiO₂ catalysts were found to be significantly more active in the CO oxidation reaction [1] than catalysts based on non-porous TiO₂ powder (P25). Catalytically active thin Au/TiO₂ films are prepared by deposition of the Au/TiO₂ catalyst, e.g. via dip coating on planar oxide substrates. The structural integrity and the chemical properties of the obtained layers are characterized by electron microscopy methods and XPS, respectively. The local catalytic activity and homogeneity of the mesoporous Au/TiO₂ films for CO oxidation is studied by mass spectrometry, using a scanning mass spectrometer setup. Furthermore, IR measurements are planned in order to derive combined catalytic and in-situ spectroscopic information.
[1] Y. Denkwitz et al., Appl.Catal.B 91, 2009, 470.
M. Roos et al., Rev.Sci.Instrum. 78, 2007, 084104.